Review of Scientific Instruments
The implementation of a scanning microscope capable of working in confocal, atomic force and apertureless near field configurations is presented. The microscope is designed to operate in the temperature range 4–300 K, using conventional helium flow cryostats. In atomic force microscope(AFM) mode, the distance between the sample and an etchedtungsten tip is controlled by a self-sensing piezoelectrictuning fork. The vertical position of both the AFM head and microscope objective can be accurately controlled using piezoelectric coarse approach motors. The scanning is performed using a compact XYZ stage, while the AFM and optical head are kept fixed, allowing scanning probe and optical measurements to be acquired simultaneously and in concert. The free optical axis of the microscope enables both reflection and transmission experiments to be performed.
Fodor, Petru S.; Zhu, H.; Patil, N. G.; and Levy, J., "Variable-Temperature Scanning Optical and Force Microscope" (2004). Physics Faculty Publications. 208.