Document Type
Article
Publication Date
2004
Publication Title
Review of Scientific Instruments
Abstract
The implementation of a scanning microscope capable of working in confocal, atomic force and apertureless near field configurations is presented. The microscope is designed to operate in the temperature range 4–300 K, using conventional helium flow cryostats. In atomic force microscope(AFM) mode, the distance between the sample and an etchedtungsten tip is controlled by a self-sensing piezoelectrictuning fork. The vertical position of both the AFM head and microscope objective can be accurately controlled using piezoelectric coarse approach motors. The scanning is performed using a compact XYZ stage, while the AFM and optical head are kept fixed, allowing scanning probe and optical measurements to be acquired simultaneously and in concert. The free optical axis of the microscope enables both reflection and transmission experiments to be performed.
Repository Citation
Fodor, Petru S.; Zhu, H.; Patil, N. G.; and Levy, J., "Variable-Temperature Scanning Optical and Force Microscope" (2004). Physics Faculty Publications. 208.
https://engagedscholarship.csuohio.edu/sciphysics_facpub/208
DOI
10.1063/1.1784560
Version
Publisher's PDF
Volume
75
Issue
9
Comments
This work was supported by NSF(Grant No.9802784)and DARPA(Grant No. DAAD19-01-1-0650)