Document Type
Article
Publication Date
2002
Publication Title
Physical Review B
Abstract
Magnetic characteristics of epitaxial Ni1-xCox(001) (x=0, 0.16, and 0.50) films with nominal 200 nm thickness on Cu(001)/Si(100) substrates have been investigated by magnetization and ferromagnetic resonance measurements in order to better clarify the rationale for the large variation in the magnetic exchange stiffness constant A, previously determined from different measurements. The exchange constant as well as the saturation magnetization, effective demagnetizing field, fourth-order magnetocrystalline, and second-order perpendicular uniaxial magnetic anisotropy fields has been determined. The analyses of low-temperature saturation magnetization data on these films yield A values that increase from 0.82×10-6erg/cm for a pure Ni film to 2.27×10-6erg/cm for the Ni0.50Co0.50 film. Furthermore, spin-wave resonance volume modes observed in x=0 and 0.16 films indicate that the surface plays a role in the exchange stiffness constant determination as the surface anisotropy constants are found to be approximately 1 and 4 erg/cm2, respectively. The latter value is substantially larger than that for any other system reported so far.
Repository Citation
Talagala, P.; Fodor, Petru S.; Naik, Haddad R.; Wenger, Lowell E.; Vaishnava, P. P.; and Naik, V. M., "Determination of Magnetic Exchange Stiffness and Surface Anisotropy Constants in Epitaxial Ni_ {1-x} Co_ {x}(001) Films" (2002). Physics Faculty Publications. 200.
https://engagedscholarship.csuohio.edu/sciphysics_facpub/200
DOI
10.1103/PhysRevB.66.144426
Version
Publisher's PDF
Publisher's Statement
©2002 American Physical Society
Volume
66
Issue
14
Comments
This work was supported by the National Science Foundation Grant No. DGE-9870720.